Showing posts with label electron. Show all posts
Showing posts with label electron. Show all posts

Sunday, September 30, 2012

Powerful Microscopes

THE SCIENCE OF POWERFUL MICROSCOPES

ELB @ Elect Lens Boost
GMM - Humanoido Labs
GENIUS MOLECULAR MICROSCOPE
The Genius Molecular Microscope (GMM) was invented in September
of 2012 by the Big Brain Molecular Microscopy Initiative at Humanoido Labs and works by the cascation of processing data amplification to reach field magnification levels exceeding one million times. GMM is designed as an easy to use and inexpensive way to view molecular structures, to work with and design micro machines and objects within the chip, and to explore the effectual results of the nanoscopic and nanotechnology developments.

http://humanoidolabs.blogspot.tw/2012/09/genius-molecular-microscope-gmm.html


ELECTRON MICROSCOPE
The electron microscope, first developed by German engineers Ernst Ruska and Max Knoll in the 1930s, uses a particle beam of electrons to illuminate a specimen and create a highly magnified image. Electron microscopes yield much greater resolution than the older light microscopes; they can obtain magnifications of up to 1 million times, while the best light microscopes can magnify an image only about 1,500 times. An electron microscope can range from US$90,000.00 to half a million dollars.


THE SCANNING TUNNELING MICROSCOPE
The scanning tunneling microscope (STM) is among a number of instruments that allows scientists to view and manipulate nanoscale particles, atoms, and small molecules. It was invented by Gerd Binig and Heinrich Rohrer in 1986. The idea of Scanning Tunneling Microscopy STM comes from the “topografiner” developed in the early 1970’s (Young et al., 1972), that included most of the elements of an STM but can only operate with a larger tip-to surface gap (>1 nm, at which distance electron transport occurs via field emission). Deficiencies in both the mechanical and electrical systems at 1970’s limited the resolution to a few nanometers vertically and ~0.5 μm laterally. These problems were overcome ten years later by Binnig and Rohrer at the IBM Rüschlikon laboratory. They succeeded in creating an instrument with stable vacuum tunneling and precision scanning capabilities – the conditions required for atomic resolution imaging. STM has revolutionized the study of surfaces and is rapidly becoming a required tool in almost every surface characterization laboratory. In addition, it has led to the development of a host of related techniques, collectively known as scanning probe microscopy (SPM).


http://conf.ncku.edu.tw/research/articles/e/20080606/5.html


ATOMIC FORCE MICROSCOPE
Atomic force microscopes (AFMs) gather information by "feeling" the surface with a mechanical probe. Gerd Binig, along with Calvin Quate and Christoph Gerber, developed the first AFM in 1986. Product Example: The package include the technical integration of an AFM into an imaging ellipsometern of the nanofilm_ep3 series. Take advantage of the convenience of imaging ellipsometry to visualize thin films and surface structures, and then zoom into nanometer details with Scanning Probe Microscopy on the same spot! The integration is done by an intelligent sample handling, integrating complementary data from two independent methods without the need for laborious sample positioning. The technical integration of a Scanning Probe microscope enables the user to: * measure the same field of view with imaging ellipsometer and scanning probe microscope * observe nano-steps in the live contrast-image of the ellipsometer, draw your region of interest around the nano-steps, and record surface film thickness, profiles/maps with nanofilm_ep3 (large field of view, quick) or by the AFM (submicron lateral resolution, slow ~ 3 min for an 80 µm by 80 µm scan) * map thickness and optical properties (refractive index/extintion) and 3D-profile/surface-roughness at the same sopt on a sample within minutes, due to software-controlled sample transport between imaging ellipsometer and Atomic force microscope with smaller than 20 µm accuracy and 2 µm repeatability


http://www.directindustry.com/prod/accurion-gmbh/atomic-force-microscopes-afm-71503-606558.html

LINKS
http://www.nano.gov/nanotech-101/what/seeing-nano

Sunday, September 2, 2012

Molecular Microscopy Initiative

BIG BRAIN INITIATIVE
MOLECULAR MICROSCOPY INITIATIVE


Delving into the Macroscopic, the Big Brain begins a new initiative to look into new worlds of microscopic machines and molecular constructs. For this, the Brain needs a new and more powerful microscope. Previously the Big Brain used the Surface Mount Microscope, a camera based device that optically imaged processor boards with surface mount components.

For the Molecular Microscope Initiative, a new kind of microscope is needed. The requirements include showing the components inside a chip, showing built machines and objects in a chip, and exploring Nanotechnology. For these purposes, the Big Brain intends to invent a new microscope with the following guidelines and features:

* minimal or no parts
* no mechanical components
* utilizes over 720 processors
* black & white and/or color imaging
* can rival and sub for an Electron Microscope
* can replace an electron microscope
* designed to show larger molecular structures
* uses simple yet clever construction
* easy to use
* simple or no setup
* no cost
* quickly implemented
* built from common elements
* capable of showing nano machines
* can show the machines & objects inside a chip
* can view the microscopic chip structure
* vast magnifying capabilities from 100X to one million times
* built in a relatively short time period
* operated by Big Brain supercomputer