Interface Molecular Stage Cascader & PGT Telescope

Interface a Molecular Stage Cascader to the New PGT Telescope

Hooking Up the Molecular Stage Cascader MSC
to the PGT Telescope
 
The Experiment - It’s an exciting and original bold experiment to attach the new created Molecular Stage Cascader atop the PGT Telescope (within and above the base data train) and view the first incoming results and the spectacular effects never seen before. What strange new worlds will be revealed in this new emerged world macrocosm? What creatures of the telescope honed ultimate deep will emerge? Will new previously invisible life forms living sub stratas make their presence known? The answers to all these questions can be answered by installing the MSC. The permanent use of the new MSC now ushers in a new age of telescopes. This creates a type of Molecular PGT Telescope or MPGT Molecular Paradigmic Genius Telescope. The name is shortened to MGT Molecular Genius Telescope.

"The first test will obtain a baseline data set and create a specific strip FOV and engage the MSC on a selected regio. We will leave the MSC running in the AMP Cascading mode for fourteen cycles and then create a comparison pool noting the gains. The interest is in the number of cascations possible without the result of empty MAG. Some peak number will result from which the machine will tune."

Powerful Microscopes

THE SCIENCE OF POWERFUL MICROSCOPES

ELB @ Elect Lens Boost

GMM - Humanoido Labs

GENIUS MOLECULAR MICROSCOPE

The Genius Molecular Microscope (GMM) was invented in September

of 2012 by the Big Brain Molecular Microscopy Initiative at Humanoido Labs and works by the cascation of processing data amplification to reach field magnification levels exceeding one million times. GMM is designed as an easy to use and inexpensive way to view molecular structures, to work with and design micro machines and objects within the chip, and to explore the effectual results of the nanoscopic and nanotechnology developments.

http://humanoidolabs.blogspot.tw/2012/09/genius-molecular-microscope-gmm.html

ELECTRON MICROSCOPE
The electron microscope, first developed by German engineers Ernst Ruska and Max Knoll in the 1930s, uses a particle beam of electrons to illuminate a specimen and create a highly magnified image. Electron microscopes yield much greater resolution than the older light microscopes; they can obtain magnifications of up to 1 million times, while the best light microscopes can magnify an image only about 1,500 times. An electron microscope can range from US$90,000.00 to half a million dollars.

THE SCANNING TUNNELING MICROSCOPE
The scanning tunneling microscope (STM) is among a number of instruments that allows scientists to view and manipulate nanoscale particles, atoms, and small molecules. It was invented by Gerd Binig and Heinrich Rohrer in 1986. The idea of Scanning Tunneling Microscopy STM comes from the “topografiner” developed in the early 1970’s (Young et al., 1972), that included most of the elements of an STM but can only operate with a larger tip-to surface gap (>1 nm, at which distance electron transport occurs via field emission). Deficiencies in both the mechanical and electrical systems at 1970’s limited the resolution to a few nanometers vertically and ~0.5 μm laterally. These problems were overcome ten years later by Binnig and Rohrer at the IBM Rüschlikon laboratory. They succeeded in creating an instrument with stable vacuum tunneling and precision scanning capabilities – the conditions required for atomic resolution imaging. STM has revolutionized the study of surfaces and is rapidly becoming a required tool in almost every surface characterization laboratory. In addition, it has led to the development of a host of related techniques, collectively known as scanning probe microscopy (SPM).

http://conf.ncku.edu.tw/research/articles/e/20080606/5.html

ATOMIC FORCE MICROSCOPE
Atomic force microscopes (AFMs) gather information by "feeling" the surface with a mechanical probe. Gerd Binig, along with Calvin Quate and Christoph Gerber, developed the first AFM in 1986. Product Example: The package include the technical integration of an AFM into an imaging ellipsometern of the nanofilm_ep3 series. Take advantage of the convenience of imaging ellipsometry to visualize thin films and surface structures, and then zoom into nanometer details with Scanning Probe Microscopy on the same spot! The integration is done by an intelligent sample handling, integrating complementary data from two independent methods without the need for laborious sample positioning. The technical integration of a Scanning Probe microscope enables the user to: * measure the same field of view with imaging ellipsometer and scanning probe microscope * observe nano-steps in the live contrast-image of the ellipsometer, draw your region of interest around the nano-steps, and record surface film thickness, profiles/maps with nanofilm_ep3 (large field of view, quick) or by the AFM (submicron lateral resolution, slow ~ 3 min for an 80 µm by 80 µm scan) * map thickness and optical properties (refractive index/extintion) and 3D-profile/surface-roughness at the same sopt on a sample within minutes, due to software-controlled sample transport between imaging ellipsometer and Atomic force microscope with smaller than 20 µm accuracy and 2 µm repeatability

http://www.directindustry.com/prod/accurion-gmbh/atomic-force-microscopes-afm-71503-606558.html

LINKS
http://www.nano.gov/nanotech-101/what/seeing-nano