THE SCIENCE OF POWERFUL MICROSCOPES
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| ELB @ Elect Lens Boost |
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| GMM - Humanoido Labs |
GENIUS MOLECULAR MICROSCOPE
http://humanoidolabs.blogspot.tw/2012/09/genius-molecular-microscope-gmm.html
ELECTRON MICROSCOPE
The electron microscope, first
developed by German engineers Ernst Ruska and Max Knoll in the 1930s,
uses a particle beam of electrons to illuminate a specimen and create a
highly magnified image. Electron microscopes yield much greater
resolution than the older light microscopes; they can obtain
magnifications of up to 1 million times, while the best light
microscopes can magnify an image only about 1,500 times. An electron microscope can range from US$90,000.00 to half a million dollars.

THE SCANNING TUNNELING MICROSCOPE
The
scanning tunneling microscope (STM) is among a number of instruments
that allows scientists to view and manipulate nanoscale particles,
atoms, and small molecules. It was invented by Gerd
Binig and Heinrich Rohrer in 1986. The idea of Scanning Tunneling Microscopy STM comes from the “topografiner” developed in the early 1970’s (Young et al.,
1972), that included most of the elements of an STM but can only
operate with a larger tip-to surface gap (>1 nm, at which distance
electron transport occurs via field emission). Deficiencies in both the
mechanical and electrical systems at 1970’s limited the resolution to a
few nanometers vertically and ~0.5 μm laterally. These problems were
overcome ten years later by Binnig and Rohrer at the IBM Rüschlikon
laboratory. They succeeded in creating an instrument with stable vacuum
tunneling and precision scanning capabilities – the conditions required
for atomic resolution imaging. STM has revolutionized the study of
surfaces and is rapidly becoming a required tool in almost every surface
characterization laboratory. In addition, it has led to the development
of a host of related techniques, collectively known as scanning probe
microscopy (SPM).
http://conf.ncku.edu.tw/research/articles/e/20080606/5.html

ATOMIC FORCE MICROSCOPE
Atomic
force microscopes (AFMs) gather information by "feeling" the surface
with a mechanical probe. Gerd Binig, along with Calvin Quate and
Christoph Gerber, developed the first AFM in 1986. Product Example: The package include the technical integration of an AFM into an imaging ellipsometern of the nanofilm_ep3 series. Take
advantage of the convenience of imaging ellipsometry to visualize thin
films and surface structures, and then zoom into nanometer details with
Scanning Probe Microscopy on the same spot! The integration is done
by an intelligent sample handling, integrating complementary data from
two independent methods without the need for laborious sample
positioning. The technical integration of a Scanning Probe microscope enables the user to: * measure the same field of view with imaging ellipsometer and scanning probe microscope * observe nano-steps in the live contrast-image of the ellipsometer,
draw your region of interest around the nano-steps, and record surface
film thickness, profiles/maps with nanofilm_ep3 (large field of view,
quick) or by the AFM (submicron lateral resolution, slow ~ 3 min for an
80 µm by 80 µm scan) * map thickness and optical properties
(refractive index/extintion) and 3D-profile/surface-roughness at the
same sopt on a sample within minutes, due to software-controlled sample
transport between imaging ellipsometer and Atomic force microscope with
smaller than 20 µm accuracy and 2 µm repeatability
http://www.directindustry.com/prod/accurion-gmbh/atomic-force-microscopes-afm-71503-606558.html
LINKS
http://www.nano.gov/nanotech-101/what/seeing-nano